SN74BCT8374ADWR Integrated Circuits Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

$10.99

SKU SN74BCT8374ADWR

Height 6.00 (in)

Width 4.00 (in)

Depth 2.00 (in)

Availability In Stock

Stock 500

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SN74BCT8374ADWR Integrated Circuits Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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2 Years

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