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  • SN74BCT8374ADWR Integrated Circuits Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

    • SN74BCT8374ADWR Integrated Circuits Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

    AVLIS-CO

    $10.99
    SKU:
    SN74BCT8374ADWR
    UPC:
    027511991276
    Condition:
    New
    Availability:
    In Stock
    Width:
    4.00 (in)
    Height:
    6.00 (in)
    Depth:
    2.00 (in)
    WL:
    WL
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    Product Description

    SN74BCT8374ADWR Integrated Circuits Scan Test Device with D-Type Edge-Triggered Flip-Flops IC 24-SOIC

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    Other Details

    2 Years

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    Custom Field

    WL WL

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